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Index by Author:
Volume 42, Issue 3, August 6, 2003 [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abernethy, William B., III [Full Text] [PDF]; Alter, David A. [Abstract] [Full Text] [PDF]; Andreassen, Arne K. [Abstract] [Full Text] [PDF]; Asano, Ryuta [Abstract] [Full Text] [PDF]; Asanoi, Hidetsugu [Abstract] [Full Text] [PDF]; Austin, Peter C. [Abstract] [Full Text] [PDF]
B: Baboonian, Christina [Full Text] [PDF]; Bachmann, Georg [Abstract] [Full Text] [PDF]; Barragán, Antonio [Abstract] [Full Text] [PDF]; Barrios, Ysamar [Abstract] [Full Text] [PDF]; Bawaney, Imran [Abstract] [Full Text] [PDF]; Bijnens, Bart [Abstract] [Full Text] [PDF]; Bijsterveld, Nick R. [Abstract] [Full Text] [PDF]; Boddicker, Kimberly A. [Abstract] [Full Text] [PDF]; Bolli, Roberto [Abstract] [Full Text] [PDF]; Bonow, Robert O. [Abstract] [Full Text] [PDF]; Boura, Judith A. [Abstract] [Full Text] [PDF]; Bowles, Karla R. [Abstract] [Full Text] [PDF]; Bowles, Neil E. [Abstract] [Full Text] [PDF]; Brandt, Roland R. [Abstract] [Full Text] [PDF]; Breithardt, Ole-A. [Abstract] [Full Text] [PDF]; Bricker, J. Timothy [Abstract] [Full Text] [PDF]; Büller, Harry R. [Abstract] [Full Text] [PDF]; Burke, James F. [Abstract] [Full Text] [PDF]
C: Chandra, Harish R. [Abstract] [Full Text] [PDF]; Choo, Joseph K. [Full Text] [PDF]; Claus, Piet [Abstract] [Full Text] [PDF]; Cohen, Meryl S. [Abstract] [Full Text] [PDF]; Cornelussen, Richard N. M. [Abstract] [Full Text] [PDF]; Cotter, Bruno [Abstract] [Full Text] [PDF]
D: Dae, Michael W. [Abstract] [Full Text] [PDF]; Dauerman, Harold L. [Full Text] [PDF]; Davies, Loyd R. [Abstract] [Full Text] [PDF]; de la Rosa, Alejandro [Abstract] [Full Text] [PDF]; De Vera, Antonia [Abstract] [Full Text] [PDF]; DeMaria, Anthony N. [Abstract] [Full Text] [PDF]; DeMaria, Anthony N. [Full Text] [PDF]; Dietz, Rainer [Abstract] [Full Text] [PDF]; Dill, Thorsten [Abstract] [Full Text] [PDF]; Dixon, Simon R. [Abstract] [Full Text] [PDF]; Dukkipati, Srinivas [Abstract] [Full Text] [PDF]; Duque, Amelia [Abstract] [Full Text] [PDF]
E: Endresen, Knut [Abstract] [Full Text] [PDF]
F: Fang, Zhi You [Abstract] [Full Text] [PDF]; Fieno, David S. [Abstract] [Full Text] [PDF]; Friedrich, Matthias G. [Abstract] [Full Text] [PDF]; Fujii, Nozomu [Abstract] [Full Text] [PDF]
G: Gao, Dong-Wei [Abstract] [Full Text] [PDF]; Gaynor, J. William [Abstract] [Full Text] [PDF]; Geiran, Odd [Abstract] [Full Text] [PDF]; González, Antonio [Abstract] [Full Text] [PDF]; Grines, Cindy L. [Abstract] [Full Text] [PDF]; Gross, Michael [Abstract] [Full Text] [PDF]
H: Haider, Husnain K. [Full Text] [PDF]; Hamm, Christian W. [Abstract] [Full Text] [PDF]; Hanrath, Peter [Abstract] [Full Text] [PDF]; Hare, Joshua [Abstract] [Full Text] [PDF]; Harjai, Kishore J. [Abstract] [Full Text] [PDF]; Hasegawa, Bruce H. [Abstract] [Full Text] [PDF]; Herbots, Lieven [Abstract] [Full Text] [PDF]; Hernández, Domingo [Abstract] [Full Text] [PDF]; Hoch, Jeffrey S. [Abstract] [Full Text] [PDF]; Hognestad, Aina [Abstract] [Full Text] [PDF]; Holm, Torbjorn [Abstract] [Full Text] [PDF]; Hosoda, Saichi [Abstract] [Full Text] [PDF]; Hutter, Adolph M., Jr [Full Text] [PDF]
I: Igawa, Akihiko [Abstract] [Full Text] [PDF]; Inoue, Hiroshi [Abstract] [Full Text] [PDF]
J: John, Anna S. [Abstract] [Full Text] [PDF]; Jones, Janice L. [Abstract] [Full Text] [PDF]; Judd, Robert M. [Abstract] [Full Text] [PDF]
K: Kasegawa, Hitoshi [Abstract] [Full Text] [PDF]; Kato, Bun-ichi [Abstract] [Full Text] [PDF]; Kearney, Debra L. [Abstract] [Full Text] [PDF]; Kerber, Richard E. [Abstract] [Full Text] [PDF]; Kim, Raymond J. [Abstract] [Full Text] [PDF]; Kindermann, Wilfried [Full Text] [PDF]; Kitahara, Koichi [Abstract] [Full Text] [PDF]; Kjekshus, John K. [Abstract] [Full Text] [PDF]; Klein, George J. [Abstract] [Full Text] [PDF]; Kowey, Peter R. [Abstract] [Full Text] [PDF]; Krahn, Andrew D. [Abstract] [Full Text] [PDF]; Kunichika, Hideki [Abstract] [Full Text] [PDF]; Kunichika, Naomi [Abstract] [Full Text] [PDF]; Kürer, Cheryl C. [Full Text] [PDF]
L: Lankipalli, Ramarao S. [Abstract] [Full Text] [PDF]; Laynez, Ignacio [Abstract] [Full Text] [PDF]; Leano, Rodel [Abstract] [Full Text] [PDF]; Lee, Randall J. [Abstract] [Full Text] [PDF]; Leesar, Massoud A. [Abstract] [Full Text] [PDF]; Lei, Ye [Full Text] [PDF]; Levi, Marcel [Abstract] [Full Text] [PDF]; Liang, Chang-seng [Full Text] [PDF]; Lorenzo, Victor [Abstract] [Full Text] [PDF]
M: Mahrholdt, Heiko [Abstract] [Full Text] [PDF]; Marino, Bradley S. [Abstract] [Full Text] [PDF]; Martín, Basilio [Abstract] [Full Text] [PDF]; Marwick, Thomas H. [Abstract] [Full Text] [PDF]; Masugata, Hisashi [Abstract] [Full Text] [PDF]; Matsumura, Takayoshi [Abstract] [Full Text] [PDF]; McCarthy, Robert [Abstract] [Full Text] [PDF]; McElhinney, Doff B. [Abstract] [Full Text] [PDF]; McKenna, William [Full Text] [PDF]; Mehra, Mandeep R. [Full Text] [PDF]; Meijers, Joost C. M. [Abstract] [Full Text] [PDF]; Messroghli, Daniel [Abstract] [Full Text] [PDF]; Misu, Kazuhiko [Abstract] [Full Text] [PDF]; Moons, Arno H. [Abstract] [Full Text] [PDF]; Musco, Simone [Abstract] [Full Text] [PDF]
N: Nagayama, Masatoshi [Abstract] [Full Text] [PDF]; Najos-Valencia, Ofelia [Abstract] [Full Text] [PDF]; Naylor, C. David [Abstract] [Full Text] [PDF]; Ni, Jiyuan [Abstract] [Full Text] [PDF]; Nozawa, Takashi [Abstract] [Full Text] [PDF]
O: O’Neill, William W. [Abstract] [Full Text] [PDF]; Ohtaki, Eiji [Abstract] [Full Text] [PDF]
P: Parker, Michele [Abstract] [Full Text] [PDF]; Pauschinger, Matthias [Abstract] [Full Text] [PDF]; Pepine, Carl J. [Full Text] [PDF]; Peschar, Maaike [Abstract] [Full Text] [PDF]; Peters, Barry [Abstract] [Full Text] [PDF]; Peters, Ron J. G. [Abstract] [Full Text] [PDF]; Picano, Eugenio [Full Text] [PDF]; Prinzen, Frits W. [Abstract] [Full Text] [PDF]
R: Ragosta, Michael [Full Text] [PDF]; Ramabadran, R. S. [Abstract] [Full Text] [PDF]; Rau, Matthias [Abstract] [Full Text] [PDF]; Regenfus, Matthias [Abstract] [Full Text] [PDF]; Ricken, Wolfgang [Abstract] [Full Text] [PDF]; Robbers-Visser, Daniëlle [Abstract] [Full Text] [PDF]
S: Sadeghi, H. Mehrdad [Abstract] [Full Text] [PDF]; Salido, Eduardo [Abstract] [Full Text] [PDF]; Scharhag, Jürgen [Full Text] [PDF]; Schultheiss, Heinz-Peter [Abstract] [Full Text] [PDF]; Schulz-Menger, Jeanette [Abstract] [Full Text] [PDF]; Shujia, Jiang [Full Text] [PDF]; Sievers, Richard E. [Abstract] [Full Text] [PDF]; Sim, A./Prof Eugene K. W. [Full Text] [PDF]; Simonsen, Svein [Abstract] [Full Text] [PDF]; Sinha, Anil M. [Abstract] [Full Text] [PDF]; Skanes, Allan C. [Abstract] [Full Text] [PDF]; Spray, Thomas L. [Abstract] [Full Text] [PDF]; Stellbrink, Christoph [Abstract] [Full Text] [PDF]; Stoddard, Marcus F. [Abstract] [Full Text] [PDF]; Stokke, Oddvar [Abstract] [Full Text] [PDF]; Sumiyoshi, Tetsuya [Abstract] [Full Text] [PDF]; Sutherland, George R. [Abstract] [Full Text] [PDF]
T: Tanaka, Kaoru [Abstract] [Full Text] [PDF]; Tang, Xian-Liang [Abstract] [Full Text] [PDF]; Tobaru, Tetsuya [Abstract] [Full Text] [PDF]; Torres, Armando [Abstract] [Full Text] [PDF]; Towbin, Jeffrey A. [Abstract] [Full Text] [PDF]; Tu, Jack V. [Abstract] [Full Text] [PDF]
U: Uhlich, Frank [Abstract] [Full Text] [PDF]; Umemura, Jun [Abstract] [Full Text] [PDF]; Urhausen, Axel [Full Text] [PDF]
V: van der Woerd, Wendy [Abstract] [Full Text] [PDF]; Ventura, Hector O. [Full Text] [PDF]; Verbeek, Xander A. A. M. [Abstract] [Full Text] [PDF]; Vernooy, Kevin [Abstract] [Full Text] [PDF]
W: Wagner, Anja [Abstract] [Full Text] [PDF]; Wergeland, Ragnhild [Abstract] [Full Text] [PDF]; Wernovsky, Gil [Abstract] [Full Text] [PDF]; Wisenbaugh, Thomas [Full Text] [PDF]; Wolf, Paul L. [Abstract] [Full Text] [PDF]; Wu, Max C. [Abstract] [Full Text] [PDF]; Wuthrich, Scott [Abstract] [Full Text] [PDF]
X: Xuan, Yu-Ting [Abstract] [Full Text] [PDF]
Y: Yan, Gan-Xin [Abstract] [Full Text] [PDF]; Yee, Raymond [Abstract] [Full Text] [PDF]
Z: Zhang, Yi [Abstract] [Full Text] [PDF]; Zimmerman, M. Bridget [Abstract] [Full Text] [PDF]